Electromigration:
- For fixes of the Electro migration violations ,will increase the width of the metal layers
- If will increase the metal width of that net ,the net resistance capacitance will decrease it leads to fastened the data
- Due to that that, the delay of the metal layer will decrease
- Due to lesser values of the R and C the transition of that metal layer may increase it leads to hold time violations
- This timing violations are based on the life time of the chip
No comments:
Post a Comment